We demonstrate a silicon electronic–photonic integrated 25 Gb/s nonreturn-to-zero transmitter that includes driver circuits, depletion-type Si ring modulator, Ge photodetector, temperature sensor, on-chip heater, and temperature controller, all monolithically integrated on a 0.25 μm photonic BiCMOS technology platform. The integrated transmitter successfully provides stable and optimal 25 Gb/s modulation characteristics against external temperature fluctuation.

We present an accurate, easy-to-use large-signal SPICE circuit model for depletion-type silicon ring modulators (Si RMs). Our model includes both the electrical and optical characteristics of the Si RM and consists of circuit elements whose values change depending on modulation voltages. The accuracy of our model is confirmed by comparing the SPICE simulation results of 25 Gb/s non-return-to-zero (NRZ) modulation with the measurement. The model is used for performance optimization of monolithically integrated Si photonic NRZ and pulse-amplitude-modulation 4 transmitters in the standard SPICE circuit design environment.

A polarization-diversity loop with a silicon waveguide with a lateral p-i-n diode as a nonlinear medium is used to realize polarization insensitive four-wave mixing. Wavelength conversion of seven dual-polarization 16-quadrature amplitude modulation (QAM) signals at 16 GBd is demonstrated with an optical signal-to-noise ratio penalty below 0.7 dB. High-quality converted signals are generated thanks to the low polarization dependence (≤0.5 dB) and the high conversion efficiency (CE) achievable. The strong Kerr nonlinearity in silicon and the decrease of detrimental free-carrier absorption due to the reverse-biased p-i-n diode are key in ensuring the high CE levels.

We demonstrate an integrated Si optical single-sideband (OSSB) modulator composed of a parallel dual-ring modulator (PDRM) and a quadrature hybrid coupler (QHC). Both the PDRM and the QHC are carefully designed for 30 GHz opearation, and their operations are verified by measurement. The Si OSSB modulator successfully generates a single sideband with larger than 15 dB suppression of the undesired sideband.

We experimentally observe that Si micro-ring modulator (MRM) modulation characteristics are strongly influenced by the modulation data rate and the data pattern and determine this influence is due to the temperature increase caused by dynamic power dissipation within the Si MRM device. We also quantitatively determine the amount of Si MRM resonance wavelength shift due to different modulation data rates, data patterns, and modulation voltages. Our results should be of great help for achieving reliable and optimal modulation characteristics for Si MRMs.